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ETRO Publications

IEEE Style

Conference Publication

E. Nyssen, M. Bister, R. Deklerck and J. Cornelis, “Segment labeling, based on Probability Distribution Maps,” in Intl. Symposium In Memoriam Pierre Devijver, Intl. Symposium In Memoriam Pierre Devijver, pp. 119-123, Royal Military Academy, Brussels, Belgium, 1999, pp. 1.

Other Reference Styles
Current ETRO Authors

Prof. Dr. Ir. Rudi Deklerck

+32 (0)02 629 168

rdeklerc@etrovub.be

more info

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IRIS • LAMI • AVSP

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