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ETRO Publications

IEEE Style
Journal Publication

S. Winkler Winkler, C. Wen Chen, A. Raake, P. Schelkens and L. Skorin-Kapov, “Introduction to the Special Issue on Measuring Quality of Experience for Advanced Media Technologies and Services,” IEEE Journal of Selected Topics in Signal Processing, vol. 11, no. 1, pp. 3-5, Feb. 2017.
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Current ETRO Authors

Prof. Dr. Ir. Peter Schelkens

+32 (0)02 629 168

pschelke@etrovub.be

more info
Other Publications

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IRIS • LAMI • AVSP

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IRIS • LAMI • AVSP

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IRIS • LAMI • AVSP

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IRIS • LAMI • AVSP

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