|
|
P. Weckx, M. Simicic, K. Nomoto, M. Ono, B. Parvais, B. Kaczer, P. Raghavan, D. Linten, K. Sawada, H. Ammo, S. Yamakawa, A. Spessot, D. Verkest and A. Mocuta, “Defect-based compact modeling for RTN and BTI variability,” in International reliability symposium, Institute of Electrical and Electronics Engineers Inc, May. 2017.
|
|
