|
|
V. Kilchytska, B. Kazemi Esfeh, C. Gimeno, B. Parvais, N. Planes, M. Haond and D. Flandre, “Comparative study of non-linearities in 28 nm node FDSOI and Bulk MOSFETs,” in oint International EUROSOl Workshop and International Conference on Ultimate Integration on Silicon-ULIS, EUROSOI-ULIS 2017, Institute of Electrical and Electronics Engineers Inc, Jun. 2017, pp. 4.
|
|
