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ETRO Publications

BibTex Style
Conference Publication

@InProceedings{Pub_7678,

author = {L. Sheng, C. De Tandt, W. Ranson and R. Vounckx},

title={Reliability Characterization of Thermal Micro-structures Implemented on 0.8 µm CMOS Chips},

booktitle = {International Reliability Physics Symposium. IRPS 2000},

publisher = {International Reliability Physics Symposium. IRPS 2000, Vol. 38, pp. 112-117, San Jose, USA},

year={2000},

pages={1}

}
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Current ETRO Authors

Prof. Dr. Roger Vounckx

+32 (0)02 629 102

rvounckx@etrovub.be

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