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@InProceedings{Pub_8872, author = {K. Miyaguchi, B. Parvais, L. Ragnarsson, P. Wambacq, P. Raghavan, A. Mercha, A. Mocuta, D. Verkest and A. Thean}, title={Modeling FinFET metal gate stack resistance for 14nm node and beyond}, booktitle = {2015 International Conference on IC Design & Technology (ICICDT)}, publisher = {IEEE}, year={2015} }
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