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@InProceedings{Pub_9765, author = {P. Weckx, M. Simicic, K. Nomoto, M. Ono, B. Parvais, B. Kaczer, P. Raghavan, D. Linten, K. Sawada, H. Ammo, S. Yamakawa, A. Spessot, D. Verkest and A. Mocuta}, title={Defect-based compact modeling for RTN and BTI variability}, booktitle = {International reliability symposium}, publisher = {Institute of Electrical and Electronics Engineers Inc}, month={May}, year={2017} }
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