|
|
@InProceedings{Pub_9852, author = {B. Parvais, P. Wambacq, A. Mercha, D. Verkest, A. Thean, K. Sawada, K. Nomoto, T. Oishi and H. Ammo}, title={A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS}, booktitle = {11th IEEE Asian Solid-State Circuits Conference, A-SSCC 2015}, publisher = {Institute of Electrical and Electronics Engineers Inc}, month={Jan}, year={2016} }
|
|
