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%0 Conference Paper %A V. Putcha %A E. Bury %A J. Franco %A A. Walke %A U. Peralagu %A A. Alian %A B. Kaczer %A N. Waldron %A D. Linten %A B. Parvais %A N. Collaert %T Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications %B 2020 IEEE International Reliability Physics Symposium, IRPS 2020 %I Institute of Electrical and Electronics Engineers Inc %8 Apr. 2020
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