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%0 Conference Paper %A Y. Xiang %A A. Verhulst %A B. Parvais %A N. Horiguchi %A G. Groeseneken %A M. Garcia Bardon %A M. Nur K. Alam %A M. Thesberg %A B. Kaczer %A P. Roussel %A M. I. Popovici %A L. A. Ragnarsson %T Physical Insights on Steep Slope FEFETs including Nucleation-Propagation and Charge Trapping %B 65th Annual IEEE International Electron Devices Meeting, IEDM 2019 %I Institute of Electrical and Electronics Engineers Inc %8 Dec. 2019
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