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Conference Publication
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%0 Conference Paper %A E. Cristofani %A G. Pandey %A N. Deligiannis %A J. Stiens %T Compressed sensing and defect-based dictionaries for characteristics extraction in mm-wave non-destructive testing %B International Conference on Infrared, Millimeter and Terahertz Wave %I IEEE %8 2016 %P 2
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