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Journal Publication
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%0 Journal Article %A C. Soens %A G. Van Der Plas %A P. Wambacq %A S. Donnay %A M. Kuijk %T Performance degradation of an LC-tank VCO by impact of digital switching noise in a lightly doped substrate %B IEEE JOURNAL OF SOLID-STATE CIRCUITS %V 40 %P 1472-1481 %8 Jul. 2005
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