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Journal Publication
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%0 Journal Article %A C. Soens %A G. Van Der Plas %A P. Wambacq %A S. Donnay %A M. Kuijk %A A. Barel %T Performance degradation of RF circuits due to impact of digital switching noise %B IEEE JOURNAL OF SOLID-STATE CIRCUITS %V 40 %N 7 %P 1472-1481 %8 Jan. 2005
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