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Conference Publication
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%0 Conference Paper %A K. Miyaguchi %A B. Parvais %A L. Ragnarsson %A P. Wambacq %A P. Raghavan %A A. Mercha %A A. Mocuta %A D. Verkest %A A. Thean %T Modeling FinFET metal gate stack resistance for 14nm node and beyond %B 2015 International Conference on IC Design & Technology (ICICDT) %I IEEE %8 2015
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