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%0 Conference Paper %A B. Parvais %A P. Wambacq %A A. Mercha %A D. Verkest %A A. Thean %A K. Sawada %A K. Nomoto %A T. Oishi %A H. Ammo %T A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS %B 11th IEEE Asian Solid-State Circuits Conference, A-SSCC 2015 %I Institute of Electrical and Electronics Engineers Inc %8 Jan. 2016
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