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Journal Publication

Process-Induced Power-Performance Variability in Sub-5-nm III–V Tunnel FETs

This publication appears in: IEEE Transactions on Electron Devices

Authors: Y. Xiang, A. S. Verhulst, D. Yakimets, B. Parvais, A. Mocuta and G. Groeseneken

Volume: 66

Issue: 6

Pages: 2802-2808

Publication Date: Jun. 2019
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Mr. Bertrand Parvais

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bparvais@etrovub.be

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