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Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations This publication appears in: IEEE Transactions on very large scale integration (VLSI) Systems Authors: M. Simicic, P. Weckx, B. Parvais, P. Roussel, B. Kaczer and G. Gielen Volume: 27 Issue: 3 Pages: 601-610 Publication Date: Mar. 2019
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