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Journal Publication

%0 Journal Article

%A K. Takakura

%A V. Putcha

%A E. Simoen

%A A. R. Alian

%A U. Peralagu

%A N. Waldron

%A B. Parvais

%A N. Collaert

%T Low-Frequency Noise Investigation of GaN/AlGaN Metal–Oxide–Semiconductor High-Electron-Mobility Field-Effect Transistor With Different Gate Length and Orientation

%B IEEE Transactions on Electron Devices

%V 67

%N 8

%P 3062-3068

%8 Aug. 2020

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Mr. Bertrand Parvais

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bparvais@etrovub.be

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