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@InProceedings{Pub_10532, author = {A. Grill, E. Bury, J. Michl, S. Tyaginov, D. Linten, T. Grasser, B. Parvais, B. Kaczer, M. Waltl and I. Radu}, title={Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures}, booktitle = {2020 IEEE International Reliability Physics Symposium, IRPS 2020}, publisher = {Institute of Electrical and Electronics Engineers Inc}, month={Apr}, year={2020}, pages={6} }
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