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ETRO Publications

IEEE Style

Conference Publication

E. Nyssen and L. van Kempen, “Piecewise Multilinear Modelling of Bayesian Classifiers Using LS and ML Approaches,” in ACIVS 2002, Advanced Concepts for Intel- ligent Vision Systems Ghent, Belgium September 9-11, 2002 Paper 025, Advanced Concepts for Intelligent Vision Systems (ACIVS 2002), pp. Proceedings on CD ROM: Paper 025, Gent, Belgium, 2002.

Other Reference Styles
Current ETRO Authors

Dr. Ir. Luc van Kempen

+32 (0)02 629 285

lmkempen@etrovub.be

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IRIS • LAMI • AVSP

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