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Scanning Near-field Millimeter Wave Microscope Combining Dielectric Tapered Probes and Metal Tips Authors: B. Zhu, S. Vanloocke, V. Matvejev, J. Stiens, D. De Zutter and R. Vounckx Publication Date: Sep. 2011 Pages: 536-539
Abstract: In this paper, we built a free-space scattering-type scanning near-field millimeter
wave microscope using two tapered dielectric probes facing each other and a sample in between
based on MVNA. Nylon, Teflon and PVC dielectric tapered probes are compared in this system.
We adopted a PVC probe and a Teflon probe as incident and receiving probes. The resolution is
frequency dependent. In order to increase the resolution and contrast, we additionally positioned
a metal probe tip between the dielectric tapered probe and the object under test. First experiment
results on this signal improvement concept will be reported for a 2 um tungsten probe, yielding
an increased field enhancement and leading to the contrast improvement External Link.
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