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Constant impedance scaling paradigm for scaling LC transmission lines Host Publication: Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet Authors: J. Balachandran, S. Brebels, G. Carchon, M. Kuijk, W. De Raedt, B. Nauwelaers and E. Beyne Publisher: IEEE COMPUTER SOC Publication Date: Mar. 2006 Number of Pages: 6 ISBN: 0-7695-2523-7
Abstract: Reverse scaled LC transmission lines are an effective alternative to on-chip global interconnects which severely limit the chip performance in nano-CMOS technologies. However, the main disadvantage of the LC transmission line approach is their poor wiring density. The scaling of LC transmission lines is formally analyzed with the proposed constant impedance scaling paradigm that simultaneously maximize performance and wiring density. With this paradigm, we show that the LC transmission line implementation would need a minimum pitch of 8 mu m for line lengths in the range of 10 to 20 mm, considering a low-k dielectric of relative dielectric constant of 2.7
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