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Conference Publication

@InProceedings{Pub_7974,

author = {C. Soens, C. Crunelle, P. Wambacq, G. Vandersteen, S. Donnay, Y. Rolain, M. Kuijk and A. Barel},

title={Characterization of Substrate Noise Impact on RF CMOS Integrated Circuits in Lightly Doped Substrates},

booktitle = {Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet},

publisher = {IEEE, 345 E 47TH ST, NEW YORK},

month={May},

year={2003},

pages={6}

}

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Prof. Maarten Kuijk

+32 (0)02 629 299

mkuijk@etrovub.be

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