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@InProceedings{Pub_8853, author = {D. Yakimets, T. Huynh Bao, M. Garcia Bardon, M. Dehan, N. Collaert, A. Mercha, Z. Tokei, A. Thean, D. Verkest and K. De Meyer}, title={Lateral versus vertical gate-all-around FETs for beyond 7nm technologies}, booktitle = {72nd Device Research Conference (DRC 2014)}, publisher = {IEEE}, month={Jun}, year={2014}, pages={2} }
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