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Inductor-Based ESD Protection under CDM-like ESD Stress Conditions for RF Applications Host Publication: Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet Authors: S. Thijs, J. Borremans, P. Jansen, D. Linten, M. Scholz, P. Wambacq and G. Groeseneken Publication Date: Sep. 2008 Number of Pages: 4
Abstract: Charged device model (CDM) electrostatic discharge (ESD) stress is a major concern for inductor-based ESD protection strategies for RF circuits processed in advanced nano-CMOS technologies. The CDM robustness of such protection methodology is investigated in this paper based on very-fast transmission line pulse (VFTLP) measurements. Its applicability is discussed for future technologies and RF applications.
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