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Back-gate bias effect on FDSOI MOSFET RF Figures of Merits and parasitic elements Host Publication: oint International EUROSOl Workshop and International Conference on Ultimate Integration on Silicon-ULIS, EUROSOI-ULIS 2017 Authors: B. Kazemi Esfeh, V. Kilchytska, B. Parvais, N. Planes, M. Haond and D. Flandre Publisher: Institute of Electrical and Electronics Engineers Inc Publication Date: Jun. 2017 Number of Pages: 3 ISBN: 9781509053131 External Link.
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