|
|
M. Simicic, P. Weckx, B. Parvais, P. Roussel, B. Kaczer and G. Gielen, “Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations,” IEEE Transactions on very large scale integration (VLSI) Systems, vol. 27, no. 3, pp. 601-610, Mar. 2019.
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