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@Article{Pub_10480, author = {R. Yasser Gomaa Mohamed Elkashlan, R. Rodriguez, S. Yadav, A. Khaled, U. Peralagu, A. Alian, N. Waldron, M. Zhao, P. Wambacq, B. Parvais and N. Collaert}, title={Analysis of Gate-Metal Resistance in CMOS-Compatible RF GaN HEMTs}, journal={IEEE Transactions on Electron Devices}, volume={67}, issue={11}, pages={4592-4596}, month={Sep}, year={2020} }
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