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@Article{Pub_10527, author = {K. Takakura, V. Putcha, E. Simoen, A. R. Alian, U. Peralagu, N. Waldron, B. Parvais and N. Collaert}, title={Low-Frequency Noise Investigation of GaN/AlGaN MetalOxideSemiconductor High-Electron-Mobility Field-Effect Transistor With Different Gate Length and Orientation}, journal={IEEE Transactions on Electron Devices}, volume={67}, issue={8}, pages={3062-3068}, month={Aug}, year={2020} }
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