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Journal Publication
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%0 Journal Article %A Y. Xiang %A A. S. Verhulst %A D. Yakimets %A B. Parvais %A A. Mocuta %A G. Groeseneken %T Process-Induced Power-Performance Variability in Sub-5-nm III–V Tunnel FETs %B IEEE Transactions on Electron Devices %V 66 %N 6 %P 2802-2808 %8 Jun. 2019
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