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ETRO Publications

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Conference Publication

B. Parvais, P. Wambacq, A. Mercha, D. Verkest, A. Thean, M. Sawada, K. Nomoto, T. Oishi and H. Ammo, “A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS,” in Solid-State Circuits Conference (A-SSCC), 2015 IEEE Asian, IEEE, 2015.

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Current ETRO Authors

Prof. Piet Wambacq

+32 (0)16 281 218

pwambacq@etrovub.be

more info

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