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Back-gate bias effect on UTBB-FDSOI non-linearity performance Host Publication: European Solid-State Device Research Conference Authors: B. Kazemi Esfeh, V. Kilchytska, B. Parvais, N. Planes, M. Haond, D. Flandre and J. P. Raskin Publisher: Editions Frontieres, Neuily sur Seine, France Publication Date: Oct. 2017 Number of Pages: 4 ISBN: 9781509059782 External Link.
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