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Conference Publication

@InProceedings{Pub_9767,

author = {B. Kazemi Esfeh, V. Kilchytska, B. Parvais, N. Planes, M. Haond, D. Flandre and J. P. Raskin},

title={Back-gate bias effect on UTBB-FDSOI non-linearity performance},

booktitle = {European Solid-State Device Research Conference},

publisher = {Editions Frontieres, Neuily sur Seine, France},

month={Oct},

year={2017},

pages={4}

}

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Current ETRO Authors

Mr. Bertrand Parvais

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bparvais@etrovub.be

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