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@InProceedings{Pub_8866, author = {B. Parvais, P. Wambacq, A. Mercha, D. Verkest, A. Thean, M. Sawada, K. Nomoto, T. Oishi and H. Ammo}, title={A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS}, booktitle = {Solid-State Circuits Conference (A-SSCC), 2015 IEEE Asian}, publisher = {IEEE}, year={2015} }
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