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%0 Conference Paper %A B. Kazemi Esfeh %A V. Kilchytska %A B. Parvais %A N. Planes %A M. Haond %A D. Flandre %A J. P. Raskin %T Back-gate bias effect on UTBB-FDSOI non-linearity performance %B European Solid-State Device Research Conference %I Editions Frontieres, Neuily sur Seine, France %8 Oct. 2017 %P 4
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